X-ray diffraction (XRD) was employed to analyze the texture evolution of commercial pure (CP) Ti during cold rolling and recrystallization annealing. The texture components were measured by electron backscattered diffraction (EBSD) after recrystallization annealing. The CP Ti tends to form a texture with the basal pole tilted 30°-40° away from the normal direction toward the transverse direction. The texture of the initial hot-rolled plate can be classified into three kinds, i.e., the pyramid texture (1013)[5230] and (2021)[1015], the basal plane texture (0001)[2110], and the stronger prism texture (1120)[0001]. After cold rolling and annealing (700℃, 60 min), the main texture components are the cold-rolled texture (1125)[1123] and the recrystallized texture (1013)[5230]. The texture (2021)[1015] is inherited from the texture of the initial hot-rolled plate with the decrease of orientation density gradually. The volume contents of the cold-rolled texture {2115} <0110> and the recrystallized texture {1013} <1210> are calculated by EBSD. After recrystallization annealing, the specimen is rich in the recrystallized texture and inherits some of texture components from the cold-rolled texture. When the annealing time is prolonged, the anisotropic value decreases.