School of Materials Science and Engineering, China University of Geosciences, Beijing 100083, China
中文摘要
Scanning Probe Microscope (SPM) has great advantages in quantitative micromorphology analysis because of its convenience in obtaining micromorphology information of materials on nanometer or atomic scale under control of a computer. Based on an established SPM quantitative micromorphology analysis model, an SPM image analysis software Which can calculate both two- and three-dimensional micromorphology parameters is developed.
Scanning Probe Microscope (SPM) has great advantages in quantitative micromorphology analysis because of its convenience in obtaining micromorphology information of materials on nanometer or atomic scale under control of a computer. Based on an established SPM quantitative micromorphology analysis model, an SPM image analysis software Which can calculate both two- and three-dimensional micromorphology parameters is developed.
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