留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码
Volume 8 Issue 4
Dec.  2001
数据统计

分享

计量
  • 文章访问数:  283
  • HTML全文浏览量:  79
  • PDF下载量:  19
  • 被引次数: 0
Guanghua Yu, Chunlin Chai, Fengwu Zhu, Jimei Xiao,  and Wuyan Lai, XPS Studies of Chemical States of NiO/NiFe Interface, J. Univ. Sci. Technol. Beijing, 8(2001), No. 4, pp. 270-273.
Cite this article as:
Guanghua Yu, Chunlin Chai, Fengwu Zhu, Jimei Xiao,  and Wuyan Lai, XPS Studies of Chemical States of NiO/NiFe Interface, J. Univ. Sci. Technol. Beijing, 8(2001), No. 4, pp. 270-273.
引用本文 PDF XML SpringerLink
Materials

XPS Studies of Chemical States of NiO/NiFe Interface

  • Ta/NTiO/NiFe/Ta multilayers were prepared by radio frequency reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached 9.6 × 103 A/m. The compositions and chemical states at the interface region of NiO/NiFe were studied using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique, The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe = Ni + FeO and 3NiO+2Fe =3 Ni+Fe2O3. The thickness of the chemical reaction area estimated by angle-resolved XPS was about 1-1.5 nm. These interface reaction products appear magnetic defects, and the exchange coupling field Hex and the coereivity Hc of NiO/NiFe are affected by these defects.
  • Materials

    XPS Studies of Chemical States of NiO/NiFe Interface

    + Author Affiliations
    • Ta/NTiO/NiFe/Ta multilayers were prepared by radio frequency reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached 9.6 × 103 A/m. The compositions and chemical states at the interface region of NiO/NiFe were studied using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique, The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe = Ni + FeO and 3NiO+2Fe =3 Ni+Fe2O3. The thickness of the chemical reaction area estimated by angle-resolved XPS was about 1-1.5 nm. These interface reaction products appear magnetic defects, and the exchange coupling field Hex and the coereivity Hc of NiO/NiFe are affected by these defects.
    • loading

    Catalog


    • /

      返回文章
      返回