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Volume 8 Issue 4
Dec.  2001
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Guanghua Yu, Chunlin Chai, Fengwu Zhu, Jimei Xiao,  and Wuyan Lai, XPS Studies of Chemical States of NiO/NiFe Interface, J. Univ. Sci. Technol. Beijing, 8(2001), No. 4, pp. 270-273.
Cite this article as:
Guanghua Yu, Chunlin Chai, Fengwu Zhu, Jimei Xiao,  and Wuyan Lai, XPS Studies of Chemical States of NiO/NiFe Interface, J. Univ. Sci. Technol. Beijing, 8(2001), No. 4, pp. 270-273.
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Materials

XPS Studies of Chemical States of NiO/NiFe Interface

  • Ta/NTiO/NiFe/Ta multilayers were prepared by radio frequency reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached 9.6 × 103 A/m. The compositions and chemical states at the interface region of NiO/NiFe were studied using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique, The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe = Ni + FeO and 3NiO+2Fe =3 Ni+Fe2O3. The thickness of the chemical reaction area estimated by angle-resolved XPS was about 1-1.5 nm. These interface reaction products appear magnetic defects, and the exchange coupling field Hex and the coereivity Hc of NiO/NiFe are affected by these defects.
  • Materials

    XPS Studies of Chemical States of NiO/NiFe Interface

    + Author Affiliations
    • Ta/NTiO/NiFe/Ta multilayers were prepared by radio frequency reactive and dc magnetron sputtering. The exchange coupling field between NiO and NiFe reached 9.6 × 103 A/m. The compositions and chemical states at the interface region of NiO/NiFe were studied using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique, The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe = Ni + FeO and 3NiO+2Fe =3 Ni+Fe2O3. The thickness of the chemical reaction area estimated by angle-resolved XPS was about 1-1.5 nm. These interface reaction products appear magnetic defects, and the exchange coupling field Hex and the coereivity Hc of NiO/NiFe are affected by these defects.
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