Volume 17 Issue 6
Dec.  2010
Turn off MathJax
Article Contents
Chun Feng, Jing-yan Zhang, Jiao Teng, and Fu-ming Wang, Study on NiO/Fe interface with X-ray photoelectron spectroscopy, Int. J. Miner. Metall. Mater., 17(2010), No. 6, pp.777-781. https://dx.doi.org/10.1007/s12613-010-0388-3
Cite this article as: Chun Feng, Jing-yan Zhang, Jiao Teng, and Fu-ming Wang, Study on NiO/Fe interface with X-ray photoelectron spectroscopy, Int. J. Miner. Metall. Mater., 17(2010), No. 6, pp.777-781. https://dx.doi.org/10.1007/s12613-010-0388-3

Study on NiO/Fe interface with X-ray photoelectron spectroscopy

Author Affilications
Funds: 

This work was financially supported by the National Natural Science Foundation of China (Nos.50871014, 50831002, 50971021, and 50901007) and the Funding Project for Academic Human Resources Development in Institutions of Higher Learning under the Jurisdiction of Beijing Municipality (No.PHR201007122).

  • Different monolayers (ML) of Fe atoms were deposited on NiO (001) substrates or NiO underlayers using molecular beam epitaxy (MBE), pulse laser deposition (PLD), and magnetron sputtering (MS). The magnetic properties and microstructure of the films were studied. The apparent magnetic dead layer (MDL) is found to exist at the NiO/Fe interfaces of the MBE sample (about 2 ML MDL), the PLD sample (about 3 ML MDL), and the MS sample (about 4 ML MDL). X-ray photoelectron spectroscopy indicates the presence of ionic Fe (Fe2+ or Fe3+) and metallic Ni at the NiO/Fe interfaces, which may be due to the chemical reactions between Fe and NiO layers. This also leads to the formation of MDL. The thickness of the MDL and the reaction products are related with the deposition energy of the atoms on the substrates. The interfacial reactions are effectively suppressed by inserting a thin Pt layer at the NiO/Fe interface.

Catalog

    Share Article

    Article Metrics

    Article views (270) PDF downloads (7) Cited by()

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return