XPS Study of CeO2/Al2O3 film

Mei Zhang; Zhenxiang Liu; Kan Xie; Xueyan Du; Wenchao Li

Volume 6 Issue 3

Sep. 1999

Turn off MathJax

Article Contents

Article Navigation > International Journal of Minerals, Metallurgy and Materials > 1999 > 6(3): 199-200,204

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.

Cite this article as:

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO2/Al2O3 film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.

Citation:

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.

PDF( 284 KB)

Materials

XPS Study of CeO₂/Al₂O₃ film

+ Author Affiliations

Received: 5 November 1998

Abstract

Abstract

The redox capacity of CeO₂/Al₂O₃ thin film which was prepared by sol-gel method has been investigated by X-ray Photoelectron Spectrascopy (XPS). The results showed that the thin film was easier to be reduced and re-oxidized than pure CeO₂ powder. The key role played by oxygen vacancies which were created from the interaction between CeO₂ and Al,O, was also discussed.
- CeO₂/Al₂O₃ thin film;
- redox;
- interaction;
- XPS