摘要:
Ni
55.5Mn
21Ga
23.5 and Ni
54Mn
22Ga
23Sm
1 films were prepared by radio frequency (RF) magnetron sputtering. The effect of Sm dopant on the morphologic and magnetic properties of Ni
55.5Mn
21Ga
23.5 films was investigated. Sm doping can refine the particle size of the films from 100 to 60 nm, and further grain growth is not occurs even after annealing at 1073 K for 3.6 ks. Compared to Ni
55.5Mn
21Ga
23.5 films, Sm-doped Ni
54Mn
22Ga
23Sm
1 films are easier to be magnetized and have a lower martensitic transformation temperature. In addition, the Curie temperature can also be adjusted, decreasing from 350 to 325 K after Sm doping. Martensitic transformation is not observed in the Sm-free films, which is close to the Curie temperature in the Sm-doped films, giving rise to the overlap of the structural and magnetic transition temperatures.