摘要:
The interface structure between the Si and NiSi
2 epitaxially grown on the (
112) Si substrate was studied using high resolution transmission electron microscopy and computer image simulation. The results showed that the interface between Si and NiSi
2 epitaxially grown on the (
112) Si substrate has six different types:type A NiSi
2 (
111)/(
111) Si, type A NiSi
2 (001)/(001) Si, type B NiSi
2 (1
11)/(1
11) Si, type B NiSi
2 (
112)/(1
12) Si, type B NiSi
2 (2
21)/(001) Si, and type B NiSi
2 (1
14)/(1
10) Si. And there are one or more different atomic structures for one type of interface.