摘要:
The redox capacity of CeO
2/Al
2O
3 thin film which was prepared by sol-gel method has been investigated by X-ray Photoelectron Spectrascopy (XPS). The results showed that the thin film was easier to be reduced and re-oxidized than pure CeO
2 powder. The key role played by oxygen vacancies which were created from the interaction between CeO
2 and Al,O, was also discussed.