Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO2/Al2O3 film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.
Cite this article as:
Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO2/Al2O3 film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.
Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO2/Al2O3 film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.
Citation:
Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO2/Al2O3 film, J. Univ. Sci. Technol. Beijing, 6(1999), No. 3, pp. 199-200,204.
Metallurgy School, University of Science and Technology Beijing, Beijing 100083, China
Institute of physics Chinese Academy of Science, Beijing 100080, China
中文摘要
The redox capacity of CeO2/Al2O3 thin film which was prepared by sol-gel method has been investigated by X-ray Photoelectron Spectrascopy (XPS). The results showed that the thin film was easier to be reduced and re-oxidized than pure CeO2 powder. The key role played by oxygen vacancies which were created from the interaction between CeO2 and Al,O, was also discussed.
The redox capacity of CeO2/Al2O3 thin film which was prepared by sol-gel method has been investigated by X-ray Photoelectron Spectrascopy (XPS). The results showed that the thin film was easier to be reduced and re-oxidized than pure CeO2 powder. The key role played by oxygen vacancies which were created from the interaction between CeO2 and Al,O, was also discussed.
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