Abstract: Cu films of 30nm and 15 nm thick were deposited on MgO(001) substrates at 185℃ by dc plasma-sputtering at 1.9kV and 8 mA in pure Ar gas. A dc bias voltage V_s, of 0 V or -80 V was applied to the substrate during deposition. Structural and electrical proper-ties have been investigated by cross-sectional transmission electron microscopy (XTEM), high resolution XTEM (XHRTEM) and by measuring temperature coefficient of electrical resistance (TCR;η) in the temperature interval of -135℃ to 0 ℃. The Cu film is polycrystalline at V_s= 0 V while it epitaxially grows with Cu(00) || MgO(001) and Cu0 10 || MgO010 at V_s=-80 V. However, the latter has a very rough surface. The change of η with film thickness and Vs is interpreted in terms of the structure change. Misfit dislocations and lattice expansion are induced along the MgO surface to relax the strain energy due to the lattice mismatch between Cu and MgO.