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Volume 4 Issue 2
Jun.  1997
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YU Xingang, MA Hongwen, LUO Wuwen, ZHOU Ao, KOU Qinghua, and ZHAO Huifeng, TEM and TEM-EDX Analysis of Cross-section of TiO2 Thin Film and Glass Substrate, J. Univ. Sci. Technol. Beijing, 4(1997), No. 2, pp. 55-56.
Cite this article as:
YU Xingang, MA Hongwen, LUO Wuwen, ZHOU Ao, KOU Qinghua, and ZHAO Huifeng, TEM and TEM-EDX Analysis of Cross-section of TiO2 Thin Film and Glass Substrate, J. Univ. Sci. Technol. Beijing, 4(1997), No. 2, pp. 55-56.
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TEM and TEM-EDX Analysis of Cross-section of TiO2 Thin Film and Glass Substrate

  • TiO2 thin film was deposited on Na-Ca-Si glass substrate by sol-gel process. TEM observation showed that the film is compactly joined to the substrate. TEM-EDX analyses of the film, film-substrate interface, and substrate revealed that the diffusion of Na+ from the substrate to the film is negative diffusion.
  • TEM and TEM-EDX Analysis of Cross-section of TiO2 Thin Film and Glass Substrate

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