XPS Study of CeO2/Al2O3 film

Mei Zhang; Zhenxiang Liu; Kan Xie; Xueyan Du; Wenchao Li

Volume 6 Issue 3

Sep. 1999

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Abstract

International Journal of Minerals, Metallurgy and Materials > 1999 > 6(3): 199-200,204.

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing , 6(1999), No. 3, pp.199-200,204.

Cite this article as:

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing , 6(1999), No. 3, pp.199-200,204.

Cite this article as:

Mei Zhang, Zhenxiang Liu, Kan Xie, Xueyan Du, and Wenchao Li, XPS Study of CeO₂/Al₂O₃ film, J. Univ. Sci. Technol. Beijing , 6(1999), No. 3, pp.199-200,204.

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Materials

XPS Study of CeO₂/Al₂O₃ film

Mei Zhang¹⁾,
Zhenxiang Liu²⁾,
Kan Xie²⁾,
Xueyan Du¹⁾ and
Wenchao Li¹⁾

Author Affilications

Metallurgy School, University of Science and Technology Beijing, Beijing 100083, China
Institute of physics Chinese Academy of Science, Beijing 100080, China

Received: 04 November 1998; Available Online: 15 June 2021

Graphical Abstract

Abstract

Abstract

The redox capacity of CeO₂/Al₂O₃ thin film which was prepared by sol-gel method has been investigated by X-ray Photoelectron Spectrascopy (XPS). The results showed that the thin film was easier to be reduced and re-oxidized than pure CeO₂ powder. The key role played by oxygen vacancies which were created from the interaction between CeO₂ and Al,O, was also discussed.
- CeO₂/Al₂O₃ thin film,
- redox,
- interaction,
- XPS

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